Benchtop semi-auto wire bonder …
Physics
Atomic Force Microscope (In Glovebox)
A versatile AFM that can capture images of air-sensitive materials that are inherently distortion-free and reproducible. Equipped with easy tip exchange combined with SmartScan software’s one-click imaging and pre-programmed advanced modes. …
VSM (Vibrating Sample Magnetometer)
The VSM is used for measuring magnetic properties such as DC characterisation….
SQUID (Superconducting QUantum Interference Device) Magnetometer
This equipment uses SQUID-based magnetometry / susceptibility to provide a stable magnetic field for material characterisation….
Scanning MOKE (Magneto-Optical Kerr Microscope & Magnetometer)
This equipment is used for visualisation of magnetic domains and magnetization processes as well as for optically recording magnetization curves qualitatively on all kinds of magnetic materials, including bulk specimens like sheets or ribbons, magnetic films and multilayers, patterned films or micro- and nanowires….
Bruker Icon Atomic Force Microscope
AFM utilises imaging techniques for surface analysis. It allows accurate and non-destructive measurements of the topography, electrical, and magnetic properties of a sample surface with high resolution….
TEM 2010F
The transmission electron microscope is a microscope whereby a beam of electrons is transmitted through an ultra-thin specimen, interacting with the specimen as it passes through. An image is formed from the interaction of the electrons transmitted through the specimen. The image is magnified and focused onto an imaging device, such as a fluorescent screen, on a layer of photographic film, or to be detected by a sensor such as a CCD camera….
TEM 2800
The JEM-2800 is an advanced workhorse 200 kV transmission electron microscope with a Schottky-type field emission electron source. This multi-purpose S/TEM employs an user-friendly, high-stability operating system for high-resolution imaging in TEM (including diffraction modes) and STEM (imaging and EDS). Equipped with a TMP vacuum system, the JEM-2800 is particularly suited for fast screening of multiple samples….
Raman Spectrometer
The Raman microscope offers advanced confocal imaging capabilities in 2D and 3D. The true confocal Raman microscope enables the most detailed images and analyses to be obtained with speed and confidence. With guaranteed high performance and intuitive simplicity, the LabRAM HR Evolution is the ultimate instrument for Raman spectroscopy. They are widely used for standard Raman analysis, PhotoLuminescence (PL), Tip Enhanced Raman Spectroscopy (TERS) and other hybrid methods….
Aberration-corrected Analytical S/TEM
The JEM-ARM200F is a 200 kV cold field-emission, probe-corrected transmission electron microscope with a STEM resolution of 0.078 nm and TEM resolution of 0.1 nm. It also has an energy-dispersive X-ray detector and dual energy loss spectrometers that can form elemental maps at atomic resolution, and a fast CMOS camera. With its probe aberration corrector and ultra-high-resolution pole piece it is particularly suited to STEM imaging and analysis….
PerkinElmer FTIR Spectrometer, with ATR Accessory
The FTIR spectrometer allows the user to shine infrared light at a sample and measure its absorbance or transmittance spectrum. The ATR accessory enables simpler and quicker measurement compared with the traditional methods (with some trade-off)….
Fluorescence Spectrometer
The fluorescence spectrometer allows user to shine light from UV-Vis range at a sample and collect its fluorescence spectrum….
Agilent FTIR Spectrometer, with ATR Accessory
The FTIR spectrometer allows the user to shine infrared light at a sample and measure its absorbance or transmittance spectrum. The ATR accessory enables simpler and quicker measurement compared with the traditional methods (with some trade-off)….
UV-Vis Spectrometer with an Integrating Sphere
The UV-Vis spectrometer allows user to shine light in the UV-visible range through a sample and measure its absorbance or transmittance spectrum. The integrating sphere expands its capability allowing measurement of reflectance spectrum (diffuse or specular)….
UV-Vis Spectrometer
The UV-Vis spectrometer allows user to shine light in the UV-visible range through a sample and measure its absorbance or transmittance spectrum….
Multipurpose Atomic Force Microscope
The Park NX10 AFM features a True Non-Contact™ scan Mode that produces high resolution and accurate data by preventing destructive tip-sample interaction during a scan. Its compact and rigid ‘Step-and-Scan’ enables programmable multiple region imaging….
X-Ray Diffractometer
For department/faculty use only.
Our current setup is suitable for examining crystal-like substrates/samples. Results will depend on how crystalline the sample is. Theta-two theta scan MSDS and RA are to be provided. XRD is for crystalline sample….
ESCA System
For department/faculty use only.
This UHV Vacuum Generators ESCALAB Mk2 system has upgraded with Omicron 7-Channeltron analyser with XPS, UPS and mono-XPS in one analysis chamber and a deposition (SIMS being replaced) chamber in the other….
Genevac Centrifugal Vacuum Evaporator
For department/faculty use only.
Centrifugal evaporator with vacuum…
Bruker Dimension Icon AFM
For department/faculty use only.
Icon XYZ Closed-Loop SPM Scan Head with nominal range of 90 µm x 90 µ and vertical range of 10 µm…
Auto Coater (FESEM)
For department/faculty use only.
Coating of non-conductive sample with platinum…
ICH 110 Memmert Climate Chamber
For department/faculty use only.
ICH 110 Memmert stability climate chambers guarantee the perfect atmosphere for climate and temperature tests. …
Beckman Optima XPN 100 Ultracentrifuge
For department/faculty use only.
Beckman Coulter’s Optima™ XPN ultracentrifuge is a premiere ultracentrifuge that offers networking capability and security customization, and tracking features to ensure chain of compliance. …
Avanti JXN-26 High Speed Centrifuge
For department/faculty use only.
Experience simplified high-throughput sample processing and more control with the JXN-26 centrifuge with powerful high-speed features, low heat output, imbalance tolerance and quiet performance. …
JSM 6700F FESEM
The JSM-6700F is a field emission scanning electron microscope (FESEM) incorporating a cold cathode field emission gun, ultra-high vacuum, and sophisticated digital technologies for high-resolution, high-quality imaging of microstructures. …
J-26S XP High Speed Centrifuge
For department/faculty use only.
The Beckman Avanti® J-26S XP High Performance Centrifuge is a fast and specialized high-speed centrifuge system exclusively designed to process up to six litres in less than 10 minutes. …
TEM 3010
The transmission electron microscope is a microscope whereby a beam of electrons is transmitted through an ultra-thin specimen, interacting with the specimen as it passes through. An image is formed from the interaction of the electrons transmitted through the specimen. The image is magnified and focused onto an imaging device, such as a fluorescent screen, on a layer of photographic film, or to be detected by a sensor such as a CCD camera….
Kristina Vaklinova
An expert from Institute for Functional Intelligent Materials (I-FIM), Kristina Vaklinova is the person to approach for queries involving in the area of Nanoscale heterostructures, Microscale heterostructures, Device fabrication…
Denis Baranov
An expert from Institute for Functional Intelligent Materials (I-FIM), Denis Baranov is the person to approach for queries involving in the area of Atomic force imaging, Scanning near field optical microscope, Fluorescent systems, and other commercial and specialized microscopy techniques…
Evlyn Chan
An expert from Faculty of Science, Pharmacy and Pharmaceutical Sciences, Physics, Evlyn Chan is the person to approach for queries involving in the area of Particle size and charge analysis, Flow cytometry, PCR and gene analysis, Microplate reading, Centrifugation, Environmental control…
Tan Jyh Harng
An expert from Faculty of Science, Physics, Tan Jyh Harng is the person to approach for queries involving in the area of Scanning electron microscopy, Sample preparation, Atomic force microscopy, X-ray photoelectron spectroscopy…
Dicky Seah
An expert from Faculty of Science, Physics, Dicky Seah is the person to approach for queries involving in the area of XRD…
Li Haobo
An expert from College of Design and Engineering, Materials Science and Engineering, T11 Shared Facilities, Li Haobo is the person to approach for queries involving in the area of Materials Science, Thin film and 2D materials deposition and characterization, Photolithography…
Ashley Xu
An expert from College of Design and Engineering, Materials Science and Engineering, T11 Shared Facilities, Electron Microscopy Facility, Ashley Xu is the person to approach for queries involving in the area of Helium ion microscopy, Material science, Optical spectroscopy, Nanofabrication, Electron microscopy, 2D materials, 2D material characterization…
Henche Kuan
An expert from College of Design and Engineering, Materials Science and Engineering, Henche Kuan is the person to approach for queries involving in the area of Thermal analysis, Stylus profilometry, Spectrometry (UV-Vis), Spectrometry (FTIR), Spectrometry (Fluorescence)…
Yang Fengzhen
An expert from College of Design and Engineering, Materials Science and Engineering, Electron Microscopy Facility, Yang Fengzhen is the person to approach for queries involving in the area of Transmission electron microscopy (TEM)…
Loh Fong Leong
An expert from College of Design and Engineering, E6 NanoFab, Loh Fong Leong is the person to approach for queries involving in the area of General tool management…
Zhou Xin
An expert from College of Design and Engineering, Electron Microscopy Facility, Zhou Xin is the person to approach for queries involving in the area of SEM, TEM, STEM, FIB, EDS, EELS…