Description
XDD beam line and its experimental station are designed for a general purpose of diffractometry, fluorescence detection and absorption spectroscopy, which will serve the research and development with structural determination, characterization and process monitoring in universities, institutes and industry in Singapore and the region.
Technical Specifications
Spectrum range: 2.3 to 10 keV
Si(111) channel-cut monochromator (CCM)
Incident beam size: 1.0 mm x 3.5 mm, by slits
Incident beam photons: 2×109 phs/s
Incident beam divergence: about 0.006°
Model
NA
Manufacturer
NA
Application
• High-resolution X-ray diffractometry (HR-XRD)
• X-ray Reflectometry (XRR):nano-measurement to determine density, thickness and roughness of a film
• Powder diffractometry
• X-ray diffraction topography
Special Remarks
Potential users contact the beamline scientists to discuss feasibility of their projects/experiments first before booking beamtime slots.
Location
Singapore Synchrotron Light Source
5 Research Link, Singapore 117603
Booking Information
Charges: S$180.00/S$230.00/S$400.00 per hour, depending on the type of service required
Service or Self-operated: Service required
Website for booking: https://ssls.nus.edu.sg/fac-xdd.html
Key Contact(s)
Yang Ping
slsyangp@nus.edu.sg
Characterisation | Analysis | Imaging | Materials | SSLS | Equipment