Description
Transmission Electron Microscope: is a microscope whereby a beam of electrons is transmitted through an ultra-thin specimen, interacting with the specimen as it passes through. An image is formed from the interaction of the electrons transmitted through
Technical Specifications
Model: JEM-3010
Electron gun filament: LaB6 filaments
Accelerating voltage: 200, 300 kV
Operation modes: TEM, DIFF, NBED, CBED, EDS
Resolution: 0.17 nm
Model
3010
Manufacturer
JEOL Ltd.
Application
Transmission electron microscope
Special Remarks
Training is required
Location
Materials Science and Engineering
College of Design and Engineering
E4-02-02
4 Engineering Drive 3
Singapore 117583
Booking Information
Charges: $50.00 per hour for MSE/ $100 per hour for Non MSE
Service or Self-operated: Service required/Self-operated
Website for booking: https://ppms.asia/nus-cde/login/?pf=3
Key Contact(s)
Yang Fengzhen
mseyf@nus.edu.sg
CDE | Characterisation | Analysis | Imaging | Chemistry | Materials | Physics | Equipment