Description
The transmission electron microscope is a microscope whereby a beam of electrons is transmitted through an ultra-thin specimen, interacting with the specimen as it passes through. An image is formed from the interaction of the electrons transmitted through the specimen; the image is magnified and focused onto an imaging device, such as a fluorescent screen, on a layer of photographic film, or to be detected by a sensor such as a CCD camera.
Technical Specifications
Electron gun emitter: ZrO/W(100)
Accelerating voltage: 100, 200 kV
PC control system: JEOL FasTEM
Operation modes: TEM, DIFF, NBED, CBED, STEM, EDS, Lorentz, Holograph
Model
JEM2010F
Manufacturer
JEOL Ltd.
Application
Transmission electron microscope
Special Remarks
Training is required
Location
Materials Science and Engineering
College of Design and Engineering
E4-02-02
4 Engineering Drive 3
Singapore 117583
Booking Information
Charges: $50.00 per hour for MSE/ $100 per hour for Non MSE
Service or Self-operated: Service required/Self-operated
Website for booking: https://ppms.asia/nus-cde/login/?pf=3
Key Contact(s)
Yang Fengzhen
mseyf@nus.edu.sg
CDE | Characterisation | Analysis | Imaging | Chemistry | Materials | Physics | Equipment