Description
The Leica EM TXP is a target preparation device for milling, sawing, grinding, and polishing samples prior to examination by SEM, TEM, and LM techniques.
Technical Specifications
In-situ observation
Automatic process
Brightness control
Model
EM TXP
Manufacturer
Leica
Application
Sample preparation
Special Remarks
Contact Chung Jing Yang for more details on booking.
Location
Electron Microscopy Facility
College of Design and Engineering
E4-02-04
4 Engineering Drive 3
Singapore 117583
Booking Information
Charges: N/A
Service or Self-operated: Self-operated
Website for booking: N/A
Key Contact(s)
Chung Jing Yang
jy.chung@nus.edu.sg
CDE | Fabrication | Materials | Equipment