Description
Stylus profilometer allows user to scan the surface of a sample with a stylus (i.e. contact method) and then characterize its surface roughness, or determine the depth of a groove, etc.
Technical Specifications
X and Y stage: 2 µm repeatability
Z stage: Soft touch stylus null
Fast data collection and analysis
Model
DektakXT
Manufacturer
Bruker
Application
Measurement of surface roughness or depth or height (or depth) of surface features
Special Remarks
Open to both NUS and external users.
Contact Ngee Hong Teo (mtnh@nus.edu.sg) and Tiho (tiho@nus.edu.sg) to schedule a project meeting.
Location
Materials Science and Engineering, T11 Shared Facilities
Temasek Laboratories @ NUS
Level 11
5A Engineering Drive 1, Singapore 117411
Booking Information
Charges: This is not in public domain yet.
Service or Self-operated: Self-operated
Website for booking: N/A
Key Contact(s)
Jian Linke
linke@nus.edu.sg
CDE | Characterisation | Analysis | Fabrication | Materials | Equipment