Description
This equipment is able to analyze the surface morphology and composition of a wide range of samples, including metals, biological specimens, and nanomaterials at the micro and nanometer scale.
Technical Specifications
Magnification: Magnification range: 250x to 100,000x
Stage:
• Stage movement: X, Y, Z, and tilt
• Maximum specimen size: 100 mm (diameter), 30 mm (height)
Detector: Secondary Electron (SE) detector
Model
JSM 6701F FESEM
Manufacturer
JEOL Ltd.
Application
Scanning electron microscopy with EDX
Special Remarks
Training required before self-operation
Email expert/facility manager for availability
Location
Chemical, Molecular and Materials Analysis Centre (CMMAC)
Electron Microscopy Lab
NUS Science S8-01-01
3 Science Drive 3, Singapore 117543
Booking Information
Charges: Yes, Charge for service and equipment.
Rates not published online
Service or Self-operated: Service and self-operated
Website for booking: https://cmmacbooking.nus.edu.sg/
Key Contact(s)
Cheng Liyan
scly@nus.edu.sg
Chemistry | FOS | Imaging | Equipment