Description
The scanning electron microscope utilizes a focused beam of electrons to scan the surface of a sample. As the electron beam interacts with the specimen, it generates signals such as secondary electrons, backscattered electrons, and characteristic X-rays. These signals are detected and processed to create an image, revealing the topography, composition, and other features of the sample at high magnifications.
Technical Specifications
Accelerating voltage: 0.02 to 30 kV
Probe current: 3 pA to 20 nA
Magnification: 10x to 1,000,000x
Electron source: Filament: Schottky field emitter
Detectors: InLens, SE2, HDBSD, EDS
Model
Sigma 300
Manufacturer
Zeiss
Application
Scanning electron microscope
Special Remarks
Training is required
Location
Materials Science and Engineering
College of Design and Engineering
E3A-05-06
7 Engineering Drive 1
Singapore 117574
Booking Information
Charges: $40.00 per hour for MSE/ $90 per hour for Non MSE
Service or Self-operated: Service required/Self-operated
Website for booking: https://ppms.asia/nus-cde/login/?pf=3
Key Contact(s)
Shen Jingjing
Shenjj2@nus.edu.sg
CDE | Characterisation | Analysis | Imaging | Materials | Equipment