Description
The JSM-6701F is suitable for observation of fine structures such as multi-layered film and nano particles fabricated by the nano technology. The high-resolution semi in-lens enables one to observe delicate specimens with minimum damage at very low accelerating voltages. At lower voltages, the fine surface structures can be observed more clearly than at higher voltages. It can be used to collect topographic information (SE and LEI mode) and observe elemental contrast (BSE mode) in the sample.
Technical Specifications
Accelerating voltage: 0.5 to 30 kV
Emitter: Cold cathode Field Emission
Imaging modes: SE, LEI, BSE
Model
JSM-6701F
Manufacturer
JEOL Ltd.
Application
Scanning electron microscopy – image sample surface morphology in high vacuum
Special Remarks
N/A
Location
Electron Microscopy Unit
NUS Medicine MD1-B1-01
12 Science Drive 2, Singapore 117549
Booking Information
Charges: Please enquire at medbx263@nus.edu.sg
Service or Self-operated: Service and self-operated
Website for booking: https://ppms.asia/medicine-nus/login/
Key Contact(s)
Micky Leong
medlln@nus.edu.sg
Biology | Biomedical Science | Life Science | Imaging | SOM | Equipment