Scanning Electron Microscope Helios 600 DualBeam

Description
This microscope enables surface back scatter electron imaging and ion milling.

Technical Specifications
1 kV to 30 kV FEG electron beam
1 kV to 30 kV Ga ion beam

Model
Helios 600

Manufacturer
Thermo Fisher Scientific

Application
• Scanning electron microscopy
• Focus ion beam milling

Special Remarks
User to request PPMS account and prepare document before submitting training request online (via PPMS). Training and orientation required before self-operation

Location
Centre for Bio Sciences (CBIS), CryoEM Facility
NUS Science S2-Basement
14 Science Drive 4, Singapore 117557

Booking Information
Charges: Yes, Charge for use of equipment.
Rates available on PPMS platform
Service or Self-operated: Self-operated
Website for booking: https://ppms.asia/singascope/?NUS_CBIS

Key Contact(s)
Shi Jian
dbsshijj@nus.edu.sg


Biology | FOS | Imaging | Equipment