Description
General purpose SEM that performs imaging of surface morphology of conductive samples, using electrons as the beam. Useful for studying surfaces with sub-micrometer structures.
Technical Specifications
Resolution of 2 nm at 1 keV
Additional accessory ports for EDX, EBSD and EBIC measurement capabilities
Model
Auriga
Manufacturer
Zeiss
Application
Scanning electron microscope
Special Remarks
Booking system available for SERIS internal staff only.
Location
Solar Energy Research Institute of Singapore, PV Devices Characterisation Group
College of Design and Engineering
E3A-04-29
7 Engineering Drive 1
Singapore 117574
Booking Information
Charges: N/A
Service or Self-operated: Service required
Website for booking: https://www.seris.nus.edu.sg/facilities-and-labs/photovoltaic-devices-characterisation-laboratories/
Key Contact(s)
Choi Kwan Bum
serckb@nus.edu.sg
Characterisation | Analysis | Imaging | Materials | SERIS | Equipment