Description
A multifunctional compact scanning system equipped with a Scanning Electrochemical Microscopy (SECM), a Scanning Vibrating System (SVET), a LEIS (Localised Electrochemical Impedance Spectroscope) and a Scanning Kelvin Probe (SKP).
Technical Specifications
N/A
Model
VersaSCAN
Manufacturer
AMETEK
Application
Localized electrochemical phenomenon study, e.g., anti-corrosion coatings
Special Remarks
N/A
Location
Institute for Functional Intelligent Materials (I-FIM)
NUS Science S9-08-08B
Analytical Lab
4 Science Drive 2, Singapore 117544
Booking Information
Charges: Contact Dr. Sourav Mitra (sourav_m@nus.edu.sg) and Dr. Chen Musen (ms_c@nus.edu.sg)
Service or Self-operated: Service and self-operated
Website for booking: N/A
Key Contact(s)
Chen Musen
ms_c@nus.edu.sg
Sourav Mitra
sourav_m@nus.edu.sg
Characterisation | Analysis | Imaging | Chemistry | Materials | IFIM | Equipment