Description
The Park NX10 AFM features a True Non-Contact™ scan Mode that produces high resolution and accurate data by preventing destructive tip-sample interaction during a scan. Its compact and rigid ‘Step-and-Scan’ enables programmable multiple region imaging.
Technical Specifications
2D Flexure-Guided Scanner with XY Scan Range 50 μm x 50 μm
XY-resolution: 0.05 nm
Z-resolution: 015 nm
Field-of-view: 480 µm × 360 µm (with 10× objective lens)
Powerful system control and data acquisition software (Park SmartScanTM)
Auto mode for quick setup and easy imaging
Stand-alone design of AFM data analysis software ‘XEI’
Model
ParkAFM-NX10
Manufacturer
Park Systems
Application
Magnetic field measurement and characterisation
Special Remarks
Training is required.
Open to both NUS and external users.
Note that equipment is currently not available.
Contact Ngee Hong Teo (mtnh@nus.edu.sg) and Tiho (tiho@nus.edu.sg) to schedule a project meeting.
Location
Materials Science and Engineering, T11 Shared Facilities
Temasek Laboratories @ NUS
Level 11
5A Engineering Drive 1, Singapore 117411
Booking Information
Charges: This is not in public domain yet.
Service or Self-operated: Self-operated
Website for booking: N/A
Key Contact(s)
Li Haobo
haobo@u.nus.edu
CDE | Characterisation | Analysis | Imaging | Materials | Physics | Equipment