Laboratory Technologist
College of Design and Engineering, E6 NanoFab
My area of expertise:
Semiconductor device cross section analyses, Advanced coating thickness and structure uniformity determination, Small contamination feature geometry and elemental composition measurement
For information on the equipment I oversee, please click here.
Contact me at elelinnl@nus.edu.sg for more information.
CDE | Characterisation | Analysis | Imaging | Materials | Expert
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