Description
The stylus profilometer allows user to scan the surface of a sample with a stylus (i.e. contact method) and then characterize its surface roughness, or determine the depth of a groove, etc.
Technical Specifications
Vertical range: 550 microns
Max. sample thickness: 21 mm
Stylus force: 1 to 99 mg
Stylus tip radius: 5 microns
Stage rotation: 360°
Model
Alpha-Step IQ
Manufacturer
KLA Tencor
Application
Measurement of surface roughness or depth or height (or depth) of surface features
Special Remarks
Training is required
Location
Materials Science and Engineering
College of Design and Engineering
E3A-05-07
7 Engineering Drive 1
Singapore 117574
Booking Information
Charges: https://ppms.asia/nus-cde/
Service or Self-operated: Self-operated
Website for booking: https://ppms.asia/nus-cde/login/?pf=3
Key Contact(s)
Henche Kuan
msehk@nus.edu.sg
CDE | Characterisation | Analysis | Materials | Equipment