Description
AFM utilises imaging techniques for surface analysis. It allows accurate and non-destructive measurements of the topography, electrical, and magnetic properties of a sample surface with high resolution.
Technical Specifications
Equipped with proprietary ScanAsyst® automatic imaging optimization technology
XY scan range: 90 µm × 90 µm (typical)
Z range: 10 µm (typical)
Sample size: Up to 200 mm
Scanning modes: TappingMode (air), Contact Mode, MFM, EFM, KPFM, Conductive AFM, etc.
Model
Dimension Icon
Manufacturer
Bruker
Application
Imaging and characterisation
Special Remarks
Training is required – https://cde.nus.edu.sg/e6nanofab/what-we-offer/
Already open to External = NTU, SUTD and other higher learning institutions, A*STAR and DSO.
Location
E6NanoFab
College of Design and Engineering
Level 5 Characterisation Lab
5 Engineering Drive 1, Singapore 117608
Booking Information
Charges: https://cde.nus.edu.sg/e6nanofab/wp-content/uploads/2023/05/20230501_Web-Published-Price-List.pdf
Service or Self-operated: Self-operated
Website for booking: https://cde.nus.edu.sg/e6nanofab/spm/
Key Contact(s)
Loh Fong Leong
e6nanofab@nus.edu.sg
CDE | Characterisation | Analysis | Imaging | Materials | Physics | Equipment