Bruker D8 Advance Powder X-Ray Diffractometer for Thin Film Samples

Description
Bruker D8 Advance is a Powder X-ray Diffractometer equipped with CuKα source, Goebel Mirror, an XYZ Stage with motorized z-adjustable and LYNXEYE XE-T detector for thin film sample measurements at room temperature.

Technical Specifications
Source: CuKα with Goebel mirrors, motorized slit and Axial soller
Stage: XYZ stage with motorized Z-adjustable stage
Detector: LYNXEYE XE-T (0D mode) with motorized slit and Equatorial soller, 2-Theta scan range: 2 to 140°
Sample: Polycrystalline thin layers on a substrate
Software: Diffrac.Suite

Model
D8 Advance

Manufacturer
Bruker

Application
Grazing incidence diffraction (GID) for thin film samples

Special Remarks
Not open for booking
Email expert/facility manager for availability

Location
Chemical, Molecular and Materials Analysis Centre (CMMAC)
X-Ray Diffraction Laboratory
NUS Science S8-02-01
3 Science Drive 3, Singapore 117543

Booking Information
Charges: Yes, Charge for measurement
Rates not available online
Service or Self-operated: Service required
Website for booking: N/A

Key Contact(s)
Tan Geok Kheng
chmtangk@nus.edu.sg

Irwan Iskandar Bin Roslan
chmiir@nus.edu.sg

Characterisation | Analysis | Chemistry | FOS | Equipment