Description
A versatile AFM that can capture images of air-sensitive materials that are inherently distortion-free and reproducible. Equipped with easy tip exchange combined with SmartScan software’s one-click imaging and pre-programmed advanced modes.
Technical Specifications
50 μm XY Scanner
Standard NX AFM Head with Decoupled Flexure-Guided Z Scanner
Direct On-Axis Motorized Optics Stage with CCD and LED Illumination
XY Stage travel range: 20 mm x 20 mm
Z Stage: Motorized stage for AFM head movement in the Z direction
• Automatic engage of the cantilever to the sample surface
• Stage travel range: 25 mm
• Stage travel step: 0.08 μm
Motorized Focus Stage for On-Axis Optics
Model
NX10
Manufacturer
Park Systems
Application
Available imaging modes
• Contact mode
• Non-contact mode
• Tapping mode
• Force Distance spectroscopy
• Nanomechanical property mapping
Electrostatic Force Microscopy (EFM)
Kelvin Probe Force Microscopy (KPFM)
Conductive AFM
Piezoelectric force microscopy
Special Remarks
N/A
Location
Institute for Functional Intelligent Materials (I-FIM)
NUS Science S9-08-08G
Advanced Microscopy Lab
4 Science Drive 2, Singapore 117544
Booking Information
Charges: Contact Dr. Sourav Mitra (sourav_m@nus.edu.sg) and Dr. Denis Baranov (bard@nus.edu.sg)
Service or Self-operated: Service and self-operated
Website for booking: https://ifim.nus.edu.sg/services/
Key Contact(s)
Denis Baranov
bard@nus.edu.sg
Characterisation | Analysis | Chemistry | Fabrication | IFIM | Imaging | Materials | Physics | Equipment