Description
The Leica EM RES102 has two saddlefield ion sources with variable ion energies, with the capability of mounting a variety of samples for argon ion milling, including SEM and TEM samples.
Technical Specifications
Beam energies: 800 eV to 10 keV
Tilt angles: ± 45°
Stage rotation/oscillation
In situ viewing during milling
Model
EM RES102
Manufacturer
Leica
Application
Sample preparation
Special Remarks
Contact Jing Yang for more details on booking.
Location
Electron Microscopy Facility
College of Design and Engineering
E4-02-04
4 Engineering Drive 3
Singapore 117583
Booking Information
Charges: N/A
Service or Self-operated: Self-operated
Website for booking: N/A
Key Contact(s)
Chung Jing Yang
jy.chung@nus.edu.sg
CDE | Fabrication | Imaging | Materials | Equipment