Description
The Fischione 1051 TEM Mill allows for the preparation of TEM lamella samples through dual argon ion beams. Equipped with a touchscreen interface and camera, it can be operated through digital inputs as well as remotely.
Technical Specifications
Beam energies: 100 eV to 10 keV
Tilt angles: -15 to +10°
Stage rotation/oscillation
In situ viewing during milling
Liquid nitrogen-cooled specimen stage
Model
1051 TEM Mill
Manufacturer
Fischione
Application
A sample preparation tool used on physical science specimens to reduce thickness to electron transparency.
Special Remarks
Contact Jing Yang for more details on booking.
Location
Electron Microscopy Facility
College of Design and Engineering
E4-02-04
4 Engineering Drive 3
Singapore 117583
Booking Information
Charges: N/A
Service or Self-operated: Self-operated
Website for booking: N/A
Key Contact(s)
Chung Jing Yang
jy.chung@nus.edu.sg
CDE | Fabrication | Imaging | Materials | Equipment