Description
The JEM-ARM200F is a 200 kV cold field-emission, probe-corrected transmission electron microscope with a STEM resolution of 0.078 nm and TEM resolution of 0.1 nm. It also has an energy-dispersive X-ray detector and dual energy loss spectrometers that can form elemental maps at atomic resolution, and a fast CMOS camera. With its probe aberration corrector and ultra-high-resolution pole piece it is particularly suited to STEM imaging and analysis.
Technical Specifications
Cold field-emission gun
CEOS ASCOR aberration corrector
UHR pole piece
Spatial resolution: 78 pm (STEM)
Energy resolution: 0.3 eV
Detectors:
• Gatan One-View CMOS, Orius SC200D
• JEOL HAADF/LAADF/BF
• Quantum Detectors MerlinEM
• Oxford X-MaXN 100TLE SDD
• Gatan GIF Quantum energy filters
Model
JEM-ARM200F
Manufacturer
JEOL Ltd.
Application
• Atomic resolution imaging
• Energy dispersive spectroscopy (EDS)
• Electron energy loss spectroscopy (EELS)
• 4D STEM
Special Remarks
Training is required – https://cde.nus.edu.sg/emf/facilities/
Location
Electron Microscopy Facility
College of Design and Engineering
E7-01
15 Kent Ridge Cres
Singapore 119276
Booking Information
Charges: https://cde.nus.edu.sg/emf/facilities/
Service or Self-operated: Self-operated
Website for booking: https://cde.nus.edu.sg/emf
Key Contact(s)
Chung Jing Yang
jy.chung@nus.edu.sg
Zhou Xin
xin_zhou@nus.edu.sg
CDE | Characterisation | Analysis | Imaging | Chemistry | Materials | Physics | Equipment