Description
The stylus profilometer allows user to scan the surface of a sample with a stylus (i.e. contact method) and then characterize its surface roughness, or determine the depth of a groove, etc.
Technical Specifications
Vertical range: 1 mm
Max. sample thickness: 50 mm
Stylus force: 0.03 to 15 mg
Stylus tip radius: 2 microns
Stage rotation: 360°
Model
Dektak XT
Manufacturer
Bruker
Application
Measurement of surface roughness or depth or height (or depth) of surface features
Special Remarks
Training is required
Location
Materials Science and Engineering
College of Design and Engineering E3A-05-07
7 Engineering Drive 1
Singapore 117574
Booking Information
Charges: https://ppms.asia/nus-cde/
Service or Self-operated: Self-operated
Website for booking: https://ppms.asia/nus-cde/login/?pf=3
Key Contact(s)
Henche Kuan
msehk@nus.edu.sg
CDE | Characterisation | Analysis | Fabrication | Materials | Equipment